| Identification and development of PCR based molecular markers linked to Septoria leaf blotch resistance genes in wheat |
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Septoria leaf blotch in wheat is a fungal disease of wheat that causes relevant yield losses. Chemical and agronomic control measures are not feasible. The application of molecular markers could complement classical plant breeding. Screening of collections of wheat landraces from Iran, validation of promising sources in replicated experiments, screening of segregating populations, and final testing and release of improved cultivars for wheat production in septoria prone regions will be applied. Populations segregating for leaf blotch resistance will be developed at ABRII. Putative QTL(s) or linked markers to leaf blotch resistance gene(s) will be detected using DNA markers and replicated experiments. Up to now the molecular response of resistant wheat genotypes to leaf blotch infection is unknown. One option would be to use the plant material to develop subtracted cDNA libraries (e.g. infected vs. non- infected, and resistant vs. susceptible plants), sequencing of obtained differentially expressed clones, bio-informatic analysis and expression analysis on macro (filter-) or micro-arrays, Northerns and RT-PCR.
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